An introduction to fast wafer level reliability monitoring for integrated circuit mass production-Reference-Cited by-同舟云学术

An introduction to fast wafer level reliability monitoring for integrated circuit mass production

Published:2004-08 Issue:8 Volume:44 Page:1209-1231
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Martin Andreas,Vollertsen Rolf-Peter

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference88 articles.

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5. Evolution in VLSI reliability engineering;Crook;IEEE IRPS,1990

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