Author:
Yang Weitao,Li Yonghong,Li Yang,Hu Zhiliang,Xie Fei,He Chaohui,Wang Songlin,Zhou Bin,He Huan,Khan Waseem,Liang Tianjiao
Funder
National Natural Science Foundation of China
Science and Technology Project of Guangdong Province
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs;Lesea;IEEE Trans. Device Mater. Reliab.,2005
2. Xilinx Continuing Experiments of Atmospheric Neutron Effects on Deep Submicron Integrated Circuits WP286 (v2.0),2016
3. Evaluating the SEE sensitivity of a 45nm SOI multi-core processor due to 14 MeV neutrons;Ramos;IEEE Trans. Nucl. Sci.,2016
4. Soft error rate comparison of 6T and 8T SRAM ICs using mono-energetic proton and neutron irradiation sources;Malagón;Microelectron. Reliab.,2017
5. Comparing proton and neutron induced SEU cross section in FPGA;Vanat,2016
Cited by
22 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献