Analysis of neutron sensitivity and data-flow error detection in ARM microprocessors using NEON SIMD extensions

Author:

Lindoso A.,Garcia-Valderas M.,Entrena L.

Funder

Ministerio de Economía y Competitividad

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference20 articles.

1. ARM Architecture Reference Manual;ARM Inc,2000

2. Intel® 64 and IA-32 Architectures, Software Developer’s Manual, Volume 1: Basic Architecture;Intel Inc.,2016

3. X. Iturbe, B. Venu; J. Jagst; E. Ozer; P. Harrod; C. Turner; J. Penton, “Addressing functional safety challenges in autonomous vehicles with the arm triple core lock-step (TCLS) architecture”, IEEE Design & Test, : DOI https://doi.org/10.1109/MDAT.2018.2799799.

4. Sensor data fusion with MPSoCSim in the context of electric vehicle charging stations;Stoychev,2016

5. Near-threshold energy- and area-efficient reconfigurable DWPT/DWT processor for healthcare-monitoring applications;Wang;IEEE Trans. Circuits Syst. Express Briefs,2015

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