Real-time soft error testing system for large-area QDR II+ SRAM array on the Tibetan Plateau-Reference-Cited by-同舟云学术

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Real-time soft error testing system for large-area QDR II+ SRAM array on the Tibetan Plateau

Published:2019-12 Issue: Volume:103 Page:113515
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Tong Teng,Zhang Zhangang,Wei Cunfeng,Lei Zhifeng,Li Mohan,Li Daowu,Wang Peilin,Hu Tingting,Feng Baotong,Li Xiaohui

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference36 articles.

1. Investigation of threshold ion range for accurate single event upset measurements in both SOI and bulk technologies;Zhang;IEEE Trans. Nucl. Sci.,2014

2. Single event effects in power MOSFETs and SRAMs due to 3 MeV, 14 MeV and fission neutrons;Hands;IEEE Trans. Nucl. Sci.,2011

3. Real-time soft-error rate measurements: a review;Autran;Microelectron. Reliab.,2014

4. Continuous high-altitude measurements of cosmic ray neutrons and SEU/MCU at various locations: correlation and analyses based-on MUSCA SEP3;Hubert;IEEE Trans. Nucl. Sci.,2013

5. Soft-error rate induced by thermal and low energy neutrons in 40 nm SRAMs;Autran;IEEE Trans. Nucl. Sci.,2012

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