An accurate model for soft error rate estimation considering dynamic voltage and frequency scaling effects-Reference-Cited by-同舟云学术

An accurate model for soft error rate estimation considering dynamic voltage and frequency scaling effects

Published:2011-02 Issue:2 Volume:51 Page:460-467
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Firouzi Farshad,Salehi Mostafa E.,Wang Fan,Fakhraie Sied Mehdi

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference58 articles.

1. Zhang Y, Chakrabarty K, Swaminathan. Energy-aware fault tolerance in fixed-priority real-time embedded systems. In: Proceedings of the international conference on computer aided design; 2003. p. 209.

2. Azizi O, Mahesri A, Lee BC, Patel SJ, Horowitz M. Energy-performance tradeoffs in processor architecture and circuit design: a marginal cost analysis. In: Proceedings of the international symposium on computer architecture; 2010. p. 26–36.

3. Computer architecture techniques for power-efficiency;Kaxiras,2008

4. Zhu D, Melhem R, Mosse D. The effects of energy management on reliability in real-time embedded systems. In: Proceedings of the international conference on computer aided design; 2004. p. 35–40.

5. Case study of reliability-aware and low-power design;Yang;IEEE Trans Very Large Scale Integr (VLSI) Syst,2008

Cited by 18 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Simulated annealing‐based high‐level synthesis methodology for reliable and energy‐aware application specific integrated circuit designs with multiple supply voltages;International Journal of Circuit Theory and Applications;2023-05-31

2. Integer linear programming-based optimization methodology for reliability and energy-aware high-level synthesis;Microelectronics Reliability;2022-12

3. A High-Level Synthesis Methodology for Energy and Reliability-Oriented Designs;IEEE Transactions on Computers;2022-01-01

4. Dependence of SEUs in Digital Cameras on Pixel size and Elevation;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06

5. Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation;2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2020