Author:
Chapman Glenn H.,Thomas Rohan,Coelho Silva Meneses Klinsmann J.,Zhao Ruoyi,Koren Israel,Koren Zahava
Cited by
1 articles.
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1. Dependence of SEUs in Digital Cameras on Pixel size and Elevation;2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2021-10-06