A synthesis methodology for AMS/RF circuit reliability: Application to a DCO design

Author:

Ferreira Pietro Maris,Petit Hervé,Naviner Jean-François

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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4. Yan B, Qin J, Dai J, Fan Q, Bernstein JB. Reliability simulation and circuit-failure analysis in analog and mix-signal applications. IEEE Trans Device Mater Rel 2009;9(3):339–47. doi:10.1109/TMR.2009.2020740. ISSN:1530-4388.

5. Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror;Bestory;Microelectron Reliab,2009

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Automated System-Level Design for Reliability: RF Front-End Application;Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design;2015

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