Automated System-Level Design for Reliability: RF Front-End Application-Reference-Cited by-同舟云学术

Automated System-Level Design for Reliability: RF Front-End Application

Published:2015 Issue: Volume: Page:363-389
ISSN:
Container-title:Computational Intelligence in Analog and Mixed-Signal (AMS) and Radio-Frequency (RF) Circuit Design
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Author:

Ferreira Pietro Maris,Ou Jack,Gaquière Christophe,Benabes Philippe

Publisher

Springer International Publishing

Link

http://link.springer.com/content/pdf/10.1007/978-3-319-19872-9_13

Reference33 articles.

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2. Oshiro L, Diego S (1995) A Design Reliability Methodology for CMOS. In: Proc. of Int. Integrated Reliability Workshop, 619, pp. 34–39

3. ITRS (2011) Modeling and simulation. Technical Report, International Roadmap for Semiconductors

4. Maricau, E., Gielen, G.: Computer-aided analog circuit design for reliability in nanometer CMOS. IEEE Trans. Emerg. Select Top. Circ. Syst. 1(1), 50–58 (2011)

5. Maricau, E., De Wit, P., Gielen, G.: An analytical model for hot carrier degradation in nanoscale CMOS suitable for the simulation of degradation in analog IC applications. Microelectron. Reliab. 48(8–9), 1576–1580 (2008). doi: 10.1016/j.microrel.2008.06.016

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