Understanding spatial resolution of laser voltage imaging-Reference-Cited by-同舟云学术

Understanding spatial resolution of laser voltage imaging

Published:2018-09 Issue: Volume:88-90 Page:255-261
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ravikumar V.K.,Lim G.,Chin J.M.,Pey K.L.,Yang J.K.W.

Funder

Singapore Economic Development Board and Advanced Micro Devices Inc.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Laser Voltage Imaging: A New Perspective of Laser Voltage Probing;Ng,2010

2. Fundamentals and Future Applications of Laser Voltage Probing;Ulrikeit,2014

3. Laser Voltage Probing in Failure Analysis of Advanced Integrated Circuits on SOI;Ravikumar,2011

4. Optical Fault Isolation and Nanoprobing Techniques for the 10 nm Technology Node and Beyond;Haartman,2015

5. Visible Laser Probing (VLP) With GaP Solid Immersion Lens Demonstrating 110 nm Resolution in Common Laser Probing Applications;Eiles,2016

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