Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach-Reference-Cited by-同舟云学术

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Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach

Published:2018-09 Issue: Volume:88-90 Page:267-272
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Villa Emanuele,Garnier Audrey,Reverdy Antoine

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference5 articles.

1. Laser Voltage Imaging: a new Perspective of Laser Voltage Probing;Ng,2010

2. Hot-carrier Luminescence: Comparison of Different CMOS Technologies;Tosi,2003

3. Advanced Scan Chain Failure Analysis Using Laser Modulation Mapping and Continuous Wave Probing;Kasapi,2011

4. Scan chain failure analysis using laser voltage imaging;Liao;Microelectron. Reliab.,2010

5. “Laser Voltage Imaging: new Perspective Using Second Harmonic Detection on Submicron Technology”. PRESENTED at ISTFA 2012;Celi,2012

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A general defect modelling and simulation-assisted approach for fault isolation in failure analysis;Microelectronics Reliability;2022-12

2. LVI-based failure analysis after PRBS defect activation: Two cases study;Microelectronics Reliability;2019-09

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