LVI-based failure analysis after PRBS defect activation: Two cases study-Reference-Cited by-同舟云学术

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LVI-based failure analysis after PRBS defect activation: Two cases study

Published:2019-09 Issue: Volume:100-101 Page:113387
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Marcello G.,Merassi A.,Medda M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Ng, Yin S., et al. Laser voltage imaging: a new perspective of laser voltage probing. In: ISTFA 2010, pp 5–13.

2. Kasapi, Steven, et al. Advanced scan chain failure analysis using laser modulation mapping and continuous wave probing. In: ISTFA 2011, pp 12–17.

3. Photoemission Microscopy-Advanced/Theory of Operation. Microelectronic Failure Analysis, Desk Reference;Boit,1999

4. Failure Analysis of Integrated Circuits: Tools and Techniques,2012

5. Complex automotive ICs defect localization driven by quiescent power supply current: three cases study;Marcello;Microelectron. Reliab.,2018

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1. Detection and Localization of Undesired Quasi-Static Transitions in a Scan Flip-Flop;Journal of Failure Analysis and Prevention;2024-09-04

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