Author:
Vogt I.,Nakamura T.,Motamedi B.,Boit C.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference8 articles.
1. “Optical Investigations of Temperature Effects in 14/16nm FinFETs” Proceedings from the 43rd International Symposium for Testing and Failure Analysis (ISTFA 2017);Vogt,2017
2. A study of photon emission from n-channel MOSFET's;Toriumi;IEEE Trans. Electron Devices,1987
3. Hot-Electron-induced photon and photocarrier generation in silicon MOSFET's;Tam;IEEE Trans. Electron Devices,1984
4. Backside spectroscopic photon emission microscopy using intensified silicon CCD;Glowacki;Microelectron. Reliab.,2014
5. Hot-Carrier Photoemission in scaled CMOS Technologies: a challenge for emission based testing and diagnostics;Tosi;IEEE Ann. Int. Reliab. Phys. Symp.,2006
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