Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions-Reference-Cited by-同舟云学术

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Published:2018-09 Issue: Volume:88-90 Page:920-924
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Aguiar Y.Q.^ORCID,Wrobel F.,Autran J.-L.,Leroux P.,Saigné F.,Touboul A.D.,Pouget V.

Funder

Horizon 2020

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference18 articles.

1. Reliability-aware synthesis of combinational logic with minimal performance penalty;Limbrick;IEEE Trans. Nucl. Sci.,2013

2. Alternative standard cell placement strategies for single-event multiple-transient mitigation;Kiddie,2014

3. A constrained layout placement approach to enhance pulse quenching effect in large combinational circuits;Du;IEEE Trans. Device Mater. Reliab.,2014

4. Simulation-based method for synthesizing soft error tolerant combinational circuits;El-Maleh;IEEE Trans. Reliab.,2015

5. Improved multiple faults-aware placement strategy: reducing the overheads and error rates in digital circuits;Bandan;IEEE Trans. Reliab.,2017

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Cross-Section Estimation for Assessment of Circuit Susceptibility to Radiation;2024 IEEE 25th Latin American Test Symposium (LATS);2024-04-09

2. Double-node-upset aware SRAM bit-cell for aerospace applications;Microelectronics Reliability;2022-06

3. Fault Tolerance Evaluation of Different Majority Voter Designs;2022 IEEE International Symposium on Circuits and Systems (ISCAS);2022-05-28

4. Impact of Atmospheric and Space Radiation on Sensitive Electronic Devices;2022 IEEE European Test Symposium (ETS);2022-05-23

5. Energy-efficient radiation hardened SRAM cell for low voltage terrestrial applications;Microelectronics Journal;2022-02