A review of electrostatic discharge (ESD) in advanced semiconductor technology-Reference-Cited by-同舟云学术

A review of electrostatic discharge (ESD) in advanced semiconductor technology

Published:2004-01 Issue:1 Volume:44 Page:33-46
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Voldman Steven H.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference59 articles.

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5. Semiconductor device degradation by high amplitude current pulses;Brown;IEEE Trans. Nucl. Sci.,1972

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