A programmable checker for automated 2.5D/3D IC latch-up verification and hot junctions detection-Reference-Cited by-同舟云学术

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A programmable checker for automated 2.5D/3D IC latch-up verification and hot junctions detection

Published:2021-09 Issue: Volume:124 Page:114310
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Medhat Dina,Dessouky Mohamed,Khalil DiaaEldin

Funder

Ain Shams University

Argonne National Laboratory

Northwestern University

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. Latchup, Hoboken, NJ;Voldman,2007

2. Guard rings: Theory, experimental quantification and design;Voldman,2005

3. Electrostatic discharge physical verification of 2.5D/3D integrated circuits;Medhat,2020

4. A programmable checker for automated 2.5-D/3-D IC ESD verification;Medhat;IEEE Trans. Compon. Packag. Manuf. Technol.,2021

5. Investigation on latch-up path between I/O PMOS and core PMOS in a 0.18-µm CMOS process;Chen,2019

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1. A novel thermal management scheme of 3D-IC based on loop heat pipe;International Journal of Thermal Sciences;2024-05

2. 3D IC Integration Using Blockchain;Lecture Notes in Networks and Systems;2023

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