Author:
Mazza B.,Patanè S.,Cordiano F.,Giliberto M.,Barletta G.,Franco G.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference18 articles.
1. Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature;Moonen,2007
2. Improving ICs reliability with high speed thermal mapping;Panarello;Integration,2018
3. Reliability assessment of power MOSFETs working in avalanche mode based on a thermal strain direct measurement;Russo;IEEE Trans. Ind. Applic.,2016
4. Reliability model application for power devices using mechanical strain real time mapping;Panarello,2016
5. Accelerated Aging With Electrical Overstress and Prognostics for Power MOSFETs. Electricrostatic Discharge Symposium Proceeedings;Saha,1999
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献