Testing of in-memory-computing memories with 8 T SRAMs-Reference-Cited by-同舟云学术

Testing of in-memory-computing memories with 8 T SRAMs

Published:2021-08 Issue: Volume:123 Page:114215
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Tsai Tsai-Ling,Li Jin-Fu,Hsu Chun-Lung,Sun Chi-Tien

Funder

Ministry of Science and Technology, Taiwan

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. A 288-kb fully parallel content addressable memory using a stacked-capacitor cell structure;Yamagata;IEEE J. Solid State Circuits,1992

2. A design for high-speed low-power CMOS fully parallel content-addressable memory macros;Miyatake;IEEE J. Solid State Circuits,2001

3. A dynamic longest prefix matching content addressable memory for IP routing;Maurya;IEEE Trans. VLSI Sys.,2011

4. A 28nm configurable memory (TCAM/BCAM/SRAM) using push-rule 6T bit cell enabling logic-in-memory;Jeloka;IEEE J. Solid State Circuits,2016

5. In-memory computation of a machine-learning classifier in a standard 6T SRAM array;Zhang;IEEE J. Solid State Circuits,2017

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1. Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability;2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT);2023-10-03

2. Structured Test Development Approach for Computation-in-Memory Architectures;2022 IEEE International Test Conference in Asia (ITC-Asia);2022-08

3. Testing and Reliability of Computing-In Memories: Solutions and Challenges;2022 IEEE International Test Conference in Asia (ITC-Asia);2022-08

4. Fault Modeling and Testing of RRAM-based Computing-In Memories;2022 IEEE International Test Conference in Asia (ITC-Asia);2022-08