Temperature distribution in multichip IGBT module and its impact on collector current sharing

Author:

Chen Cuili,Pickert Volker,Al-Greer Maher,Wang Zhiqiang,Knoll Alois Christian

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Effects of current density and chip temperature distribution on lifetime of high power IGBT modules in traction working conditions;Hamidi;Microelectron. Reliab.,1997

2. Investigation of the electro-thermal stress affecting IGBT modules in high-pulsed power resonant converters;Carastro,2009

3. Comparison of UCE and RGi based junction temperature measurement of multichip IGBT power modules;Denk,2015

4. Thermal coupling analysis in a multichip paralleled IGBT module for a DFIG wind turbine power converter;Li;IEEE Trans. Energy Convers.,2017

5. Thermal modeling of diamond-based power electronics packaging;Fabis,1999

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