A statistical study into reliability of FPGA implemented circuits: Simulation and modelling-Reference-Cited by-同舟云学术

A statistical study into reliability of FPGA implemented circuits: Simulation and modelling

Published:2021-02 Issue: Volume:117 Page:113964
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Aguirre-Morales J.D.,Marc F.

Funder

Airbus Operations

Airbus Group Innovations

Continental Automotive France

Hirex Engineering

Nexio

Safran Electrical & Power

Thales Alenia Space France

Thales Avionics

French National Agency for Research

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

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2. Nasa integrated photonics;Krainak,2018

3. Reconfigurable antennas for wireless and space applications;Christodoulou;Proc. IEEE,2012

4. Bipolar integrated circuits in SiC for extreme environment operation;Zetterling;Semicond. Sci. Technol.,2017

5. Electronics and packaging intended for emerging harsh environment applications: a review;Hassan;IEEE Transactions on Very Large Scale Integration (VLSI) Systems,2018

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