Reliability- and process-variation aware design of integrated circuits-Reference-Cited by-同舟云学术

Reliability- and process-variation aware design of integrated circuits

Published:2008-08 Issue:8-9 Volume:48 Page:1114-1122
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Alam M.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference94 articles.

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