Sensitivity improvement of ultrasonic beam induced resistance change (SOBIRCH) method with ultrasound resonance inside mold resin-Reference-Cited by-同舟云学术

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Sensitivity improvement of ultrasonic beam induced resistance change (SOBIRCH) method with ultrasound resonance inside mold resin

Published:2020-06 Issue: Volume:109 Page:113641
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Matsui Takuto,Tatsumi Kosuke,Kawashima Tomohiro,Murakami Yoshinobu,Hozumi Naohiro,Eura Shigeru,Matsumoto Toru

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference11 articles.

1. Novel OBIC observation method for detecting defects in Al stripes under stressing;Nikawa,1993

2. New laser beam heating methods applicable to fault localization and defect detection in VLSI devices;Nikawa,1996

3. An Analysis of and a Method of Enhancing the Intensity of OBIRCH Signal for Defects Observation in VLSI Metal Interconnection;Kawamura,1994

4. Device decapsulated (and/or depassivated) – retest ok – what happened?;Jacob;Microelectron. Reliab.,2007

5. Resistance change observation of wiring in semiconductor device using ultrasonic stimulation;Matsumoto,2017

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