Author:
Jacob Peter,Nicoletti Giovanni,Hauf Florian
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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4. Reiner Joachim. Latent gate oxide damage induced by ultra-fast electrostatic discharge. Series in Microelectronics, Vol. 51. Hartung-Gorre-Verlag Konstanz 1995, ISBN 3-89191-983-2 [PhD work].
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