Author:
Yongle Huang,Yifei Luo,Fei Xiao,Binli Liu,Xin Tang
Funder
National Key Basic Research Program of China
National Defense Science and Technology Key Laboratory Foundation
Science Foundation of Naval University of Engineering
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference38 articles.
1. Reliability assessment of power semiconductor devices;Georgiev,2016
2. A review on real time physical measurement techniques and their attempt to predict wear-out status of IGBT;Ghimire,2013
3. Strategy for designing accelerated aging tests to evaluate IGBT power modules lifetime in real operation mode;Thebaud;IEEE Transactions on Components and Packaging Technologies,2003
4. Real-time failure monitoring system for high power IGBT under acceleration test up to 500 A stress;Watanabe,2014
5. Design for reliability in power electronics in renewable energy systems – status and future;Wang,2013
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