Funder
National Science Foundation
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
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5. P B. Klein and S C Binari, “Photoionization spectroscopy of deep defects responsible for current collapse in nitride-based field effect transistors”, J. Phys.: Condens. Matter, vol. 15, pp. R1641–R1667, 2003.
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