A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function-Reference-Cited by-同舟云学术

A reliability evaluation method for multi-performance degradation products based on the Wiener process and Copula function

Published:2020-11 Issue: Volume:114 Page:113758
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Pan Guangze,Li Yaqiu,Li Xiaobing,Luo Qin,Wang Chunhui,Hu Xianghong

Funder

National Key R&D Program of China

Natural Science Foundation of Guangdong Province

MIIT

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference12 articles.

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2. Accurate reliability inference based on Wiener process with random effects for degradation data;Wang;Reliability Engineering & System Safety,2020

3. A reliability estimation approach via Wiener degradation model with measurement errors;Pan;Appl. Math. Comput.,2018

4. Remaining useful life prediction of electronic products based on Wiener degradation process;Lin;IFAC-PapersOnLine,2019

5. Reliability prediction of machinery with multiple degradation characteristics using double-Wiener process and Monte Carlo algorithm;Cheng;Mech. Syst. Signal Process.,2019

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