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Remaining Useful Life Prediction of Electronic Products Based on Wiener Degradation Process

  • Published:2019 Issue:24 Volume:52 Page:24-28
  • ISSN:2405-8963
  • Container-title:IFAC-PapersOnLine
  • language:en
  • Short-container-title:IFAC-PapersOnLine

Author:

Lin Wenyi,Chai Yi,Liu Qie

Publisher

Elsevier BV

Subject

Control and Systems Engineering

Reference15 articles.

1. Residual lifetime prediction of metallized film pulse capacitors;Peng;Acta Electronica Sinica,2011

2. Mis-specification analysis of linear degradation models;Peng;IEEE Transactions on Reliability,2009

3. The distributions of extreme value for Brownian Motion with nonlinear drift;Liu;J. of Math,2010

4. Remaining useful life prediction for degradation processes with long-range dependence;Zhang;IEEE Transactions on Reliability,2017

5. A. Einstein and the mathematical theory of Brownian Motion;Yang;Journal of Northwest University (Natural science edition),2006

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