1. EIA/JEDEC Standard. Steady state temperature humidity bias life test. EIA/JESD22-A101-B. Arlington (VA): Electronic Industry Association; 1997. p. 4.
2. Teverovsky A. Effect of moisture on characteristics of surface mount solid tantalum capacitors. QSS Group, Inc./Goddard Operations NASA/GSFC; 2003.
3. “Catastrophic failure”. A Publication of the National Electronics Manufacturing Center of Excellence; March 2005.
4. Dobson R. Surface mount solid tantalum capacitor new wear-out mechanism. In: CARTS – Conference; 2003. p. 141–7.
5. Devaney J. Report on a new failure mechanism for surface mount solid tantalum capacitors. In: CARTS – Conference; 1998. p. 183–7.