Using Boolean satisfiability for computing soft error rates in early design stages-Reference-Cited by-同舟云学术

Using Boolean satisfiability for computing soft error rates in early design stages

Published:2010-01 Issue:1 Volume:50 Page:149-159
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Shazli S.Z.,Tahoori M.B.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference28 articles.

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