Time dependent modeling of single particle displacement damage in silicon devices-Reference-Cited by-同舟云学术

Time dependent modeling of single particle displacement damage in silicon devices

Published:2016-05 Issue: Volume:60 Page:25-32
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Tang Du,Martin-Bragado Ignacio,He Chaohui,Zang Hang,Xiong Cen,Li Yonghong,Guo Daxi,Zhang Peng,Zhang Jinxin

Funder

National Natural Science Foundation of China

Key Program of the National Natural Science Foundation of China

State Key Laboratory Program

Spanish Government Ramón y Cajal Fellowship

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference71 articles.

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