On the prediction of radiation-induced SETs in flash-based FPGAs-Reference-Cited by-同舟云学术

On the prediction of radiation-induced SETs in flash-based FPGAs

Published:2016-09 Issue: Volume:64 Page:230-234
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Azimi S.,Du B.,Sterpone L.

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. SET characterization and mitigation in 65-nm CMOS test structures;Rezgui;IEEE Trans. Nucl. Sci.,2012

2. A novel layout-based single event transient injection approach to evaluate the soft error rate of large combinational circuits in complimentary metal-oxide-semiconductor bulk technology;Du;IEEE Trans. Reliab.,2016

3. Layout-based modeling and mitigation of multiple even transients;Ebrahimi;IEEE Trans. Comput. Aided Des. Integr. Circ. Syst.,2016

4. Radiation-induced single event transients modeling and testing on nanometric flash-based technologies;Sterpone;Elsevier Microelectron. Reliab.,2015

5. Analysis and mitigation of single event effects on flash-based FPGAs;Sterpone,2014

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