Author:
Azimi Sarah,De Sio Corrado,Portaluri Andrea,Sterpone Luca
Publisher
Springer Nature Switzerland
Reference24 articles.
1. Sierawski, B.D., et al.: Muon-induced single event upsets in deep-submicron technology. IEEE Trans. Nucl. Sci. 57(6), 3273–3278 (2010)
2. Karnik, T., Hazucha, P.: Characterization of soft errors caused by single event upsets in CMOS processes. IEEE Trans. Depend. Secure Comput. 1(2), 128–143 (2004)
3. Azimi, S., Du, B., Sterpone, L.: On the prediction of radiation-induced SETs in flash-based FPGAs. Microelectron. Reliab. 64, 230–234 (2016)
4. Dodd, P.E., Massengill, L.W.: Basic mechanisms and modeling of single-event upset in digital microelectronics. IEEE Trans. Nucl. Sci. 50(3), 583–602 (2003)
5. Lacoe, R., et al.: Application of hardness-by-design methodology to radiation-tolerant ASIC technologies. IEEE Trans. Nuc. Sci. 47(6), 2334–2341 (2000)