Author:
Alorda Bartomeu,Carmona Cristian,Torrens Gabriel,Bota Sebastia
Funder
Spanish Ministry of Science and Innovation
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
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3. Evaluation of SRAM cell write margin metrics for lifetime monitoring of BTI-induced Vth drift;2017 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS);2017-04