Author:
Buiu O.,Hall S.,Engstrom O.,Raeissi B.,Lemme M.,Hurley P.K.,Cherkaoui K.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
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5. Extraction of the capacitance of ultrathin high-K gate dielectrics
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