Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference27 articles.
1. Black JR. In: Proceedings of the 6th annual reliability of physics symposium; 1966. p. 148.
2. Current-induced marker motion in gold wires
3. Electromigration failure modes in aluminum metallization for semiconductor devices
4. Oliver CB, Bower DE. In: Proceedings of the 8th annual reliability of physics symposium; 1970. p. 116.
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