Feature extraction and damage-precursors for prognostication of lead-free electronics-Reference-Cited by-同舟云学术

Feature extraction and damage-precursors for prognostication of lead-free electronics

Published:2007-12 Issue:12 Volume:47 Page:1907-1920
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Lall Pradeep,Hande Madhura,Bhat Chandan,Islam Nokibul,Suhling Jeff,Lee Jay

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

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