Author:
Thijsse J.,van der Sluis O.,van Dommelen J.A.W.,van Driel W.D.,Geers M.G.D.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Characterization and modelling of moisture driven interface failures;van Gils;Microelectron Reliab,2004
2. Mixed-mode bending method for delamination testing;Reeder;AIAA J,1990
3. Refinements to the mixed-mode bending test for delamination toughness;Reeder;J Compos Technol Res,2003
4. Reeder JR, Crews Jr JH. Nonlinear analysis and redesign of the mixed-mode bending delamination test. Technical Memorandum 102777, NASA; 1991.
5. Crews Jr JH, Reeder JR. A mixed-mode bending apparatus for delamination testing. Technical Memorandum 100662, NASA; August 1988.
Cited by
11 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献