Failure of electrical vias manufactured in thick-film technology when loaded with short high current pulses-Reference-Cited by-同舟云学术

Failure of electrical vias manufactured in thick-film technology when loaded with short high current pulses

Published:2016-01 Issue: Volume:56 Page:121-128
ISSN:0026-2714
Container-title:Microelectronics Reliability
language:en
Short-container-title:Microelectronics Reliability

Author:

Ortolino D.,Kita J.,Beart K.,Wurm R.,Kleinewig S.,Pletsch A.,Moos R.

Funder

Bavarian Research Foundation

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference39 articles.

1. Expanding automotive electronic systems;Leen;Computer,2002

2. Application of MEMS technology in automotive sensors and actuators;Eddy,1998

3. Thick-film technology;Prudenziati;Sensors Actuators A Phys.,1991

4. Wirebonding on multilayer circuits for automotive applications using robust thick-film conductors;Schubring,1998

5. Emerging substrate technologies for harsh-environment automotive electronics applications;Fairchild,2002

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-performance electrical properties of La-based perovskite ceramics for the functional phase of thick film resistors;Journal of Alloys and Compounds;2021-06

2. Fabrication and non-destructive characterization of through-plastic-via (TPV) in flexible hybrid electronics;Flexible and Printed Electronics;2021-03-25

3. Thermal Treatment of Aerosol Deposited NiMn2O4 NTC Thermistors for Improved Aging Stability;Sensors;2018-11-15

4. Stability of low ohmic thick-film resistors under pulsed operation;Microelectronics Reliability;2018-05