Author:
Demirci Mustafa,Reviriego Pedro,Maestro Juan Antonio
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference23 articles.
1. Error-correcting codes for semiconductor memory applications: a state-of-the-art review;Chen;IBM J. Res. Dev.,1984
2. A class of optimal minimum odd-weight-column SEC-DED codes;Hsiao;IBM J. Res. Dev.,1970
3. Multiple bit upset tolerant memory using a selective cycle avoidance based SEC-DED-DAEC code;Dutta,2007
4. Impact of scaling on neutron-induced soft error in SRAMs from a 250nm to a 22nm design rule;Ibe,2010
5. Adaptive cache design to enable reliable low-voltage operation;Alameldeen;IEEE Trans. Comput.,2011
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. An Improved (24, 16) OLS Code for Single Error Correction-Double Adjacent Error Correction-Triple Adjacent Error Correction;Lecture Notes in Networks and Systems;2023
2. Towards a Latin-Square Search Engine;2019 IEEE Intl Conf on Parallel & Distributed Processing with Applications, Big Data & Cloud Computing, Sustainable Computing & Communications, Social Computing & Networking (ISPA/BDCloud/SocialCom/SustainCom);2019-12
3. Compact and power efficient SEC-DED codec for computer memory;Microsystem Technologies;2019-02-28
4. FPGA Implementation of OLS (32, 16) Code and OLS (36, 20) Code;Lecture Notes in Electrical Engineering;2017
5. DMR+: An efficient alternative to TMR to protect registers in Xilinx FPGAs;Microelectronics Reliability;2016-08