Author:
Yang Lixin,Li Dejian,Yang Xiaokun,Feng Xi,Tan Lang,Shen Chongfei,Cai Hao
Funder
State Grid Corporation of China
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference9 articles.
1. Process monitoring vehicle for SRAM critical path using ring oscillator in 7 nm Finfet;Anees,2021
2. Statistical interconnect crosstalk noise model and analysis for process variations;Jianwei;Chin. J. Electron.,2015
3. On-chip process variation monitoring circuit based on gate leakage sensing;Kim;Electron. Lett.,2010
4. A novel process corner detection circuit;Mirzoyan,2016
5. Slew-rate monitoring circuit for on-chip process variation detection;Ghosh;IEEE Trans.VLSI Syst.,2013
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