Author:
Budiman A.S.,Shin H.-A.-S.,Kim B.-J.,Hwang S.-H.,Son H.-Y.,Suh M.-S.,Chung Q.-H.,Byun K.-Y.,Tamura N.,Kunz M.,Joo Y.-C.
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Safety, Risk, Reliability and Quality,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference22 articles.
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3. Uniaxial-process-induced strained-Si: extending the CMOS roadmap
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