On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films-Reference-Cited by-同舟云学术

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On the formation and structural properties of hexagonal rare earth (Y, Gd, Dy, Er and Yb) disilicide thin films

Published:2014-10 Issue: Volume:611 Page:149-156
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Geenen F.A.,Knaepen W.,Demeulemeester J.,De Keyser K.,Jordan-Sweet J.L.,Lavoie C.,Vantomme A.,Detavernier C.

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

Reference24 articles.

1. Rare earth overlayers on silicon;Netzer;J. Phys.: Condens. Matter,1995

2. The formation of silicides from thin films of some rare-earth metals;Baglin;Appl. Phys. Lett.,1980

3. The Schottky barrier height of the contacts between some rare-earth metals (and silicides) and p-type silicon;Norde;Appl. Phys. Lett.,1981

4. Epitaxial growth of rare-earth silicides on (111)Si;Knapp;Appl. Phys. Lett.,1986

5. Oxidation suppression in Ytterbium silicidation by Ti/Ti N bicapping layer;Jiang;J. Vac. Sci. Technol. A: Vac. Surf. Films,2007

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1. Formation of Nanometric Yttrium Silicides Layers onto Si (111) Substrate by Ion Implantation;Silicon;2020-10-17

2. Axiotaxy in oxide heterostructures: Preferential orientation of BaCeO3 nanoparticles embedded in superconducting YBa2Cu3O7− thin films;Thin Solid Films;2017-09

3. Enhancement of the High Temperature Thermal Stability of Ni Based Silicide by Multiple Metal Layer Stacking;Nanoscience and Nanotechnology Letters;2017-04-01

4. Axiotaxy of Bismuth Telluride Films on InP(111)B by High-Temperature Hot Wall Epitaxy;Crystal Growth & Design;2017-03-01

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