Determination of dislocation density in GaN/sapphire layers using XRD measurements carried out from the edge of the sample-Reference-Cited by-同舟云学术

Determination of dislocation density in GaN/sapphire layers using XRD measurements carried out from the edge of the sample

Published:2020-06 Issue: Volume:825 Page:153838
ISSN:0925-8388
Container-title:Journal of Alloys and Compounds
language:en
Short-container-title:Journal of Alloys and Compounds

Author:

Serafińczuk Jarosław^ORCID,Moszak Karolina^ORCID,Pawlaczyk Łukasz^ORCID,Olszewski Wojciech^ORCID,Pucicki Damian^ORCID,Kudrawiec Robert^ORCID,Hommel Detlef^ORCID

Funder

FNP

Publisher

Elsevier BV

Subject

Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials

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