Influence of LaNiO3 bottom electrode on the structural and physical properties of ferroelectric capacitors
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference17 articles.
1. The Physics of Ferroelectric Memories
2. Low-temperature integration of lead-based ferroelectric capacitors on Si with diffusion barrier layer
3. Ferroelectricity at the Nanoscale: Local Polarization in Oxide Thin Films and Heterostructures
4. Self-poled Pb(Zr,Ti)O3 films with improved pyroelectric properties via the use of (La0.8Sr0.2)MnO3/metal substrate heterostructures
5. Detection of residual stresses in Pb(Zr0.53Ti0.47)O3 thin films prepared on LaNiO3 buffered metal substrates with Raman spectroscopy
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1. Epitaxial conducting ABO3 perovskite oxide thin films;Journal of Applied Physics;2023-06-22
2. Influence of substrate on structural and transport properties of LaNiO3 thin films prepared by pulsed laser deposition;AIP Advances;2017-02
3. Enhanced Ferroelectric Properties of Pb(Hf0.3Ti0.7)O3Thin Films by SrRuO3Bottom Electrode;Ferroelectrics;2016-02-17
4. Microstructure and mechanical properties of deformed Mg–Mn–Sn alloys;International Journal of Materials Research;2015-03-11
5. Structural, dielectric, ferroelectric and optical properties of PBCT, PBST and PCST complex thin films on LaNiO3 metallic conductive oxide layer coated Si substrates by the CSD technique;Journal of Alloys and Compounds;2014-10
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