Optical constants and fitted transmittance spectra of varies thickness of polycrystalline ZnSe thin films in terms of spectroscopic ellipsometry
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Metals and Alloys,Mechanical Engineering,Mechanics of Materials
Reference41 articles.
1. Analysis of the electrical characteristics of Zn/ZnSe/n-Si/Au–Sb structure fabricated using SILAR method as a function of temperature
2. Ultrafast time-resolved spectroscopy of ZnSe nanowires: Carrier dynamics of defect-related states
3. High-efficiency Cd-free CIGSS thin-film solar cells with solution grown zinc compound buffer layers
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