An XPS study of Si as it occurs in adsorbents, catalysts, and thin films-Reference-Cited by-同舟云学术

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An XPS study of Si as it occurs in adsorbents, catalysts, and thin films

Published:1983-04 Issue:1-4 Volume:15 Page:1-35
ISSN:0378-5963
Container-title:Applications of Surface Science
language:en
Short-container-title:Applications of Surface Science

Author:

Barr Tery L.

Publisher

Elsevier BV

Subject

General Engineering

Reference59 articles.

1. presented at ACS Symp.;Barr,1982

2. Binding-energy reference in X-ray photoelectron spectroscopy of insulators

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