Author:
York T.A.,Evans I.G.,Pokusevski Z.,Dyakowski T.
Subject
Electrical and Electronic Engineering,Metals and Alloys,Surfaces, Coatings and Films,Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials
Reference4 articles.
1. I. Grant, Particle image velocimetry: a review, in: Proceedings of the Institution of Mechanical Engineers, J. Mech. Eng. Sci.: Part C 211 (C1) (1997) 55–76.
2. An on-chip, interconnect capacitance characterization method with sub-femtofarad resolution;Chen;IEEE Trans. Semicond. Manufac.,1998
3. T.A. York, A.M. Somerville, I. Evans, A sensing circuit for micro-capacitance tomography, in: Proceedings of the 1st World Congress on Industrial Process Tomography, Buxton, UK, 14–17 April 1999, pp. 395–401 (ISBN 0-85316-193-3).
4. Process tomography: a European innovation and its application;Beck;Meas. Sci. Tech.,1996
Cited by
15 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献