Statistical subpixel-measurement technology of light-beam width and profiles-Reference-Cited by-同舟云学术

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Statistical subpixel-measurement technology of light-beam width and profiles

Published:1992-01 Issue:1 Volume:16 Page:1-15
ISSN:0143-8166
Container-title:Optics and Lasers in Engineering
language:en
Short-container-title:Optics and Lasers in Engineering

Author:

Szirányi Tamás

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference19 articles.

1. Characterizing digital image acquisition devices;Reichenbach;Optical Engineering,1991

2. Describing ID intensity transitions with Gaussian Derivatives at the resolution matching the transition widths;Warmerdam;IEEE-PAMI,1989

3. Subpixel measurement using a moment-based edge operator;Lyvers;IEEE-PAMI,1989

4. Predicting and estimating the accuracy of a subpixel registration algorithm;Cox;IEEE-PAMI,1990

5. Measurement of laser-beam diameter of some μm by moving CCD-sensor;Szirányi,1987

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Subpixel Image Restoration Algorithm;Journal of Computational and Graphical Statistics;1997-06

2. A Subpixel Image Restoration Algorithm;Journal of Computational and Graphical Statistics;1997-06

3. Subpixel pattern recognition by image histograms;Pattern Recognition;1994-08

4. Noise effects in statistical subpixel pattern recognition;Computer Analysis of Images and Patterns;1993

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