Noise effects in statistical subpixel pattern recognition

Author:

Szirányi Tamás

Publisher

Springer Berlin Heidelberg

Reference11 articles.

1. T. Szirányi: ”Statistical subpixel pattern recognition by histograms,” in Proc. 11th IAPR International Conference on Pattern Recognition, The Hague, The Netherlands, IEEE-Proc., August 30, 1992, Vol.II, pp. 705–708

2. S.E. Reichenbach, S.K. Park, R. Narayanswamy: ”Characterizing digital image acquisition devices,” Optical Engineering, Vol.30, No.2, pp. 170–177, 1991

3. I.J. Cox, J.B. Kruskal, D.A. Wallach: ”Predicting and estimating the accuracy of a subpixel registration algorithm,” IEEE Trasns. Pattern Anal. Machine Intell, Vol.PAMI-12, No.8, pp. 721–734, 1990

4. T. Szirányi, L. Illés, T. Kovács: ”Procedure and arrangement to determine a beam-diameter,” Invention, Serial No.: 201403, Budapest, 1990

5. T. Szirányi: ”Statistical subpixel measurement technology of light-beam width and profiles,” Optics and Lasers in Engineering, Vol.16, No.1, pp. 1–15, 1992

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