Author:
da Silva Jr E.F,de Vasconcelos E.A,Freire V.N
Subject
Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. The Si–SiO2 interface: Correlation of atomic structure and electrical properties
2. X-ray scattering studies of the Si-SiO2interface
3. Microscopic structure of theSiO2/Si interface
4. For a detailed bibliography of the many techniques used to probe the SiO2/Si system please refer to references cited in [1] and [2] and in the papers contained in: H.Z, Massoud, C.R. Helms, E.H. Poindexter (Eds.), Physics and Chemistry of SiO2 and the Si–SiO2 Interface 3, Electrochemical Society, Pennington, NJ, 1996.
5. Chemical and electronic structure of the SiO2/Si interface
Cited by
8 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献