Electrical and adhesion properties of plasma-polymerised ultra-low k dielectric films with high thermal stability

Author:

Uhlig M,Bertz A,Rennau M,Schulz S.E,Werner T,Gessner T

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Surfaces, Coatings and Films,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference6 articles.

1. Speeding the transition to 0.18 μm;Peters;Semiconductor International,1998

2. The National Technology Roadmap for Semiconductors, Semiconductor Industry Association SIA, 1997, pp. 101–105.

3. S.E. Schulz, A. Bertz, R. Streiter, M. Uhlig, U. Weiss, T. Werner, T. Winkler, T. Gessner, Fluoropolymer and aerogel thin films as low k dielectrics in IC metallization, in: 1998 International Conference on Solid State Devices and Materials, Hiroshima, Japan, Sept. 7–10 1998; Ext. Abstract Vol., The Japan Society of Applied Physics, p. 264.

4. P. Xu, J. Huang, K. Singh, S. Robles, W.F. Yau, Plasma enhanced CVD amorphous fluorinated carbon films as low k dielectrics, DUMIC Conf., Feb. 16–17, 1998, Palo Alto, CA.

5. Fluorinated amorphous carbon as a low-dielectric-constant interlayer dielectric;Endo;MRS Bull.,1997

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